Charge buildup during XPS analysis is a well-studied phenom-enon.
Xps peak shift series#
15, which contain Ti 2p, N 1s, and O 1s core-level spectra recorded from a series of TiN thin films grown by dc magnetron sputtering and oxidized to different extents by varying the venting temperature T v of.
![xps peak shift xps peak shift](https://www.researchgate.net/profile/Khantesh-Agrawal/post/What_does_a_peak_at_3692_eV_mean_in_case_of_silver/attachment/5b14f5d5b53d2f63c3cfbddc/AS%3A633471554834432%401528042796899/download/Ag3d_5-1_S02.jpg)
![xps peak shift xps peak shift](https://ars.els-cdn.com/content/image/1-s2.0-S0079642519300738-gr21.jpg)
Post-print standardized by MSL Academic Endeavors, the imprint of the Michael Schwartz Library at Cleveland State University, 2017.)/RD/Rect/Subj(Typewritten Text)/Subtype/FreeText/T(libuser)/Type/Annot>